Metrical information load of lines and angles in line patterns.
Acute angles and long lines are more complex than obtuse angles and short lines. This source of complexity is called metrical information, for which a measure was proposed by Leeuwenberg (1982). According to this measure, the metrical information of a static pattern is specified as the sum of the mechanical impulses necessary to move an object according to this pattern. The perceptual relevance of this metrical load was tested in an experiment in which judged complexities were gathered for a number of simple line patterns.
Hanssen
A
A
Nijmegen Institute for Cognition and Information, University of Nijmegen, The Netherlands.
Leeuwenberg
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E
van der Helm
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P
D000328:Adult; D001288:Attention; D004193:Discrimination Learning; D005260:Female; D006801:Humans; D008297:Male; D009949:Orientation; D010364:Pattern Recognition, Visual; D011601:Psychophysics