title: The effect of aluminium coating on elemental signals in X-ray microanalysis.
abstract: It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non-conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X-ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176-182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of errors in the previous interpretation is provided.
authors.affiliation: Division of Biological Sciences, Lancaster University, Bailrigg, England.
authors.forename: A P
authors.initials: AP
authors.lastname: Reid
authors.forename: K
authors.initials: K
authors.lastname: Oates
authors.forename: W T
authors.initials: WT
authors.lastname: Potts
mesh_terms: D000535:Aluminum; D002412:Cations / Q000032:analysis; D004577:Electron Probe Microanalysis / Q000379:methods*; D008855:Microscopy, Electron, Scanning / Q000379:methods
chemical_list: D002412:Cations; D000535:Aluminum