title: Temperature changes in nickel-chromium intracranial depth electrodes during MR scanning.
abstract: The authors sought to determine whether there are any heating effects of 1.5-T MR scanning upon nickel-chromium electrodes and to confirm the safety of scanning these electrodes after intracranial surgical implantation in epilepsy patients. Since there was no significant temperature increase of the electrodes tested in their experiments, the authors conclude that nickel-chromium electrodes implanted in the brain are thermally safe for MR scanning.
authors.affiliation: Brain Research Institute, UCLA 90024.
authors.forename: J
authors.initials: J
authors.lastname: Zhang
authors.forename: C L
authors.initials: CL
authors.lastname: Wilson
authors.forename: M F
authors.initials: MF
authors.lastname: Levesque
authors.forename: E J
authors.initials: EJ
authors.lastname: Behnke
authors.forename: R B
authors.initials: RB
authors.lastname: Lufkin
mesh_terms: D001921:Brain / Q000033:anatomy & histology* / Q000601:surgery; D002858:Chromium Alloys; D004567:Electrodes, Implanted; D004827:Epilepsy / Q000175:diagnosis / Q000601:surgery; D006801:Humans; D066298:In Vitro Techniques; D008279:Magnetic Resonance Imaging; D008954:Models, Biological; D008962:Models, Theoretical; D013696:Temperature
chemical_list: D002858:Chromium Alloys