Combined scanning near field optical and force microscopy.
Van Hulst
N F
NF
University of Twente, Enschede, NL.
Moers
M H
MH
Tack
R G
RG
Bölger
B
B
D004577:Electron Probe Microanalysis / Q000295:instrumentation; D007204:Indium; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation / Q000379:methods*; D012825:Silicon; D017655:Silicon Compounds; D014001:Tin; D017971:Tin Compounds
D017655:Silicon Compounds; D017971:Tin Compounds; D007204:Indium; D014001:Tin; C045358:stannic oxide; C032734:silicon nitride; D012825:Silicon