A new software package for interpreting electron diffraction contrast images of arbitrary displacement fields: SIMCON.
Janssens
K G
KG
Departement Metaalkunde en Toegepaste Materiaalkunde (MTM), K.U. Leuven, Belgium.
Vanhellemont
J
J
Van der Biest
O
O
D004577:Electron Probe Microanalysis; D007090:Image Interpretation, Computer-Assisted; D012825:Silicon / Q000737:chemistry*; D012984:Software
D012825:Silicon