title: A simple modification to the Fischione jet polishing holder to reduce the deformation of thin samples.
authors.affiliation: Electron Microscope Unit, University of the Witwatersrand, WITS, South Africa.
authors.forename: M J
authors.initials: MJ
authors.lastname: Witcomb
mesh_terms: D008854:Microscopy, Electron / Q000295:instrumentation*