title: Soot morphology: an application of image analysis in high-resolution transmission electron microscopy.
abstract: Interest in the fine structure of soots and carbon blacks is motivated by a variety of possible applications. The structure provides information on the origins of the particles and on their adsorptive and reactive properties. This paper describes a method for quantification of the structure of soots and carbon blacks based on direct electron microscopic observation followed by image analysis of these materials. High-resolution transmission electron microscopy (HRTEM) provides a very detailed observation of particle structure. The differences in soot structure, because of its complexity, may not be easily quantifiable with the human eye; therefore, high-level computer software has been used to manipulate HRTEM images. This technique involves the application of fast Fourier transforms (FFT) to single particles and the measurement of characteristic parameters such as interplanar spacings and crystallite sizes from these particles. The methodology and application of this characterization technique are presented here. Results are shown for different samples obtained from soot and carbon black particles selected to illustrate the capabilities of the methodology. Quantitative information can be obtained on structural characteristics, e.g., interplanar spacing, circularity, orientation, elongation, and length distribution of lattice fringes, as well as on the fractional coverage of the extracted pattern.
authors.affiliation: Department of Chemical Engineering, Massachusetts Institute of Technology, Cambridge 02139, USA.
authors.forename: A B
authors.initials: AB
authors.lastname: Palotás
authors.forename: L C
authors.initials: LC
authors.lastname: Rainey
authors.forename: C J
authors.initials: CJ
authors.lastname: Feldermann
authors.forename: A F
authors.initials: AF
authors.lastname: Sarofim
authors.forename: J B
authors.initials: JB
authors.lastname: Vander Sande
mesh_terms: D002244:Carbon / Q000737:chemistry*; D008854:Microscopy, Electron
chemical_list: D002244:Carbon