title: Performance of copper intrauterine devices when inserted after an expulsion.
abstract: A total of 124 women who re-inserted a TCu-200B intrauterine device (IUD) following an expulsion were followed up for 1 year after the IUD re-insertion. The cumulative expulsion rate at 6 months was 21.7 and 31.4 per 100 women at the end of the first year. Women who expelled the first IUD within the first 3 months of use had a significantly higher expulsion rate with the second IUD. Our conclusion is that women who expelled a copper IUD are at a significantly higher risk of expelling the re-inserted IUD than the first IUD. Health workers must also be informed about the high probability of another expulsion when re-inserting an IUD after an expulsion.
authors: Centro de Pesquisas das Doenças Materno-Infantis de Campinas (CEMICAMP), Campinas, Sao Pablo, Brazil.
authors: L
authors: L
authors: Bahamondes
authors: J
authors: J
authors: Díaz
authors: N M
authors: NM
authors: Marchi
authors: C A
authors: CA
authors: Petta
authors: M L
authors: ML
authors: Cristofoletti
authors: G
authors: G
authors: Gomez
mesh_terms: D000293:Adolescent; D000328:Adult; D015331:Cohort Studies; D005260:Female; D006801:Humans; D007433:Intrauterine Device Expulsion; D007435:Intrauterine Devices, Copper; D011379:Prognosis; D012008:Recurrence; D012189:Retrospective Studies; D013997:Time Factors