Imaging the internal and external pore structure of membranes in fluid: TappingMode scanning ion conductance microscopy.
We have constructed a combined TappingMode atomic force microscope and scanning ion conductance microscope. The design is based on a bent glass pipette that acts as both the force sensor and conductance probe. Measuring the pipette deflection allows more stable feedback than possible with previous versions of the scanning ion conductance microscope. Using this microscope, we have imaged synthetic membranes in both contact and tapping modes under fluid. Although contact mode operation is possible, we found that our microscope provided higher contrast and less apparent sample damage in the topographic and ionic conductance images in the tapping mode.
Department of Physics, University of California, Santa Barbara 93106, USA. proksch@stolaf.edu
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D007477:Ions; D008567:Membranes, Artificial; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods; D009685:Nuclear Envelope / Q000648:ultrastructure*; D012680:Sensitivity and Specificity; D012996:Solutions
D007477:Ions; D008567:Membranes, Artificial; D012996:Solutions