title: Recent developments in electron holography for phase microscopy.
abstract: This paper reports on the recent remarkable progress made in electron phase microscopy, especially due to the development of both a "coherent" field-emission electron beam and the related image processing techniques. With these techniques, the phase distribution of an electron beam transmitted through a specimen can now be measured with a precision of within 1/100 of the electron wavelength to observe the thickness distribution of a uniform specimen at the atomic level, the magnetic domain structures in a ferromagnetic thin film, and individual vortices in a superconducting thin film. Vortices in superconducting thin films have become dynamically observable by Lorentz microscopy.
authors.affiliation: Advanced Research Laboratory, Hitachi, Ltd., Saitama, Japan.
authors.forename: A
authors.initials: A
authors.lastname: Tonomura
mesh_terms: D006696:Holography; D008854:Microscopy, Electron / Q000379:methods*; D008858:Microscopy, Phase-Contrast / Q000379:methods