title: Cross-sectional sample preparation by focused ion beam: a review of ion-sample interaction.
abstract: A focused ion beam (FIB) was applied for cross-sectional sample preparation with both transmission electron microscopes (TEM) and scanning electron microscopes (SEM). The FIB sample preparation has the advantage of high positioning accuracy for cross sections. On the other hand, a broad ion beam (BIB) has been conventionally used for thinning TEM samples. Although both FIB and BIB use energetic ion beams, they are essentially different from each other in many aspects such as beam size, beam current density, incident angle of the beam with respect to cross sections, and beam scanning (i.e., dynamic or static beam). In this study, FIB cross-sectioning is compared with BIB thinning. We review inherent characteristics such as positioning accuracy and uniformity of cross section, radiation damage, and beam heating. Discussion is held from a view-point of ion beam and sample interaction.
authors.affiliation: Instrument Division, Hitachi, Ltd., Ibaraki, Japan.
authors.forename: T
authors.initials: T
authors.lastname: Ishitani
authors.forename: T
authors.initials: T
authors.lastname: Yaguchi
mesh_terms: D007477:Ions; D008854:Microscopy, Electron / Q000295:instrumentation / Q000379:methods*; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation / Q000379:methods*; D055585:Physical Phenomena; D010825:Physics
chemical_list: D007477:Ions