title: Induced membrane hypo/hyper-mechanosensitivity: a limitation of patch-clamp recording.
abstract: Practical limitations of the patch-clamp technique when recording mechanogated membrane ion channels are considered. Mechanical overstimulation of the patch or the cell from excessive suction/pressure protocols induces morphological and functional changes. In particular, the plasma membrane becomes decoupled from the underlying cytoskeleton to form either membrane blebs (cell-attached) or ghosts (whole cell). As a consequence, a membrane ion channel may show either a decrease or an increase in its native mechanosensitivity or even acquire mechanosensitivity. The effect varies with ion channel and cell type and presumably arises because of a disruption of membrane-cytoskeleton interactions. We consider that such disruptions are a pathological consequence of excessive mechanical stress, either during or after seal formation, rather than an immutable consequence of patch-clamp recording. By careful attention to the suction/pressure protocols during sealing and throughout recording, such artifacts can be avoided.
authors.affiliation: Department of Physiology and Biophysics, University of Texas Medical Branch, Galveston 77555, USA.
authors.forename: O P
authors.initials: OP
authors.lastname: Hamill
authors.forename: D W
authors.initials: DW
authors.lastname: McBride
mesh_terms: D000818:Animals; D005069:Evaluation Studies as Topic; D006801:Humans; D007473:Ion Channels / Q000502:physiology; D008465:Mechanoreceptors / Q000502:physiology*; D008566:Membranes / Q000502:physiology; D018408:Patch-Clamp Techniques
chemical_list: D007473:Ion Channels