title: Cantilevers and tips for atomic force microscopy.
abstract: The cantilever and the tip are at the centerpiece of the AFM. Properties such as the cantilever stiffness and resonant frequency, tip shape and sharpness, and material characteristics determine the mode of operation of the AFM and the type of experiments and measurements that can be performed. The possibility of batch fabricating cantilevers has permitted the fabrication and characterization of specialized tips for a variety of experiments. We believe that the use of new materials and tip shapes will allow new applications for the AFM in the future.
authors.affiliation: Park Scientific Instruments, Sunnyvale, CA, USA.
authors.forename: M
authors.initials: M
authors.lastname: Tortonese
mesh_terms: D000535:Aluminum; D018130:Diamond; D004553:Electric Conductivity; D004867:Equipment Design; D005898:Glass; D006046:Gold; D008422:Materials Testing; D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D010969:Plastics; D015203:Reproducibility of Results; D012825:Silicon; D017655:Silicon Compounds
chemical_list: D010969:Plastics; D017655:Silicon Compounds; D006046:Gold; D018130:Diamond; D000535:Aluminum; C032734:silicon nitride; D012825:Silicon