Optimization of thin-foil based phosphor screens for CCD imaging in TEM in the voltage range of 80-400 kV.
The voltage dependence characteristics of thin-foil based phosphor screens in the thickness range of approximately 10-60 microns are examined for CCD imaging in transmission electron microscopy (TEM) in the voltage range of 80-400 kV. The brightest screen is obtained with a P20 layer of about 12 microns at 80 kV, and a thicker screen lowers both the screen brightness and resolution. The thickness of the brightest screen is higher at higher voltage, but other considerations for a practical CCD imaging system suggest that the P20 layer should not be greater than approximately 18 microns for the voltage range stated above.
Fan
G Y
GY
Department of Neurosciences, University of California, San Diego, La Jolla 92093-0608, USA. gfan@ucsd.edu
Ellisman
M H
MH
D008854:Microscopy, Electron / Q000295:instrumentation / Q000379:methods*