title: Processor quality control in laser imaging systems.
abstract: Sensitometric techniques for performing processor quality control in laser imaging systems are analyzed in this study. The sensitivity of conventional x-ray films using simulated screen-light sensitometry is compared with helium-neon (HeNe) laser film exposed with a simulated red-light sensitometer, a standalone (reference) laser sensitometer, an experimental (unstable) laser sensitometer, and laser printers. Infrared (IR) laser film exposed with an IR laser diode and a simulated IR sensitometer are also evaluated. It is demonstrated that laser-generated step tablets provide an easy and reliable method of performing laser film processor quality control.
authors.affiliation: Eastman Kodak Company, Rochester, New York 14650, USA.
authors.forename: T M
authors.initials: TM
authors.lastname: Bogucki
authors.forename: W R
authors.initials: WR
authors.lastname: Murphy
authors.forename: C W
authors.initials: CW
authors.lastname: Baker
authors.forename: S S
authors.initials: SS
authors.lastname: Piazza
authors.forename: A G
authors.initials: AG
authors.lastname: Haus
mesh_terms: D006371:Helium; D006801:Humans; D007259:Infrared Rays; D007834:Lasers; D008962:Models, Theoretical; D009356:Neon; D011786:Quality Control; D011859:Radiography / Q000592:standards*; D012680:Sensitivity and Specificity; D013816:Thermodynamics; D014962:X-Ray Film / Q000592:standards*
chemical_list: D006371:Helium; D009356:Neon