title: Evaporated germanium films as supports for microanalysis of carbon and silicon containing specimens.
abstract: A preparation procedure is described for producing specimen supports of evaporated germanium. The germanium film is used as a replacement for films of carbon and silicon when microanalytical techniques like energy dispersive X-ray microanalysis (XRMA) or electron energy loss spectroscopy (EELS) are focusing on particulates containing these elements. The supports can be produced with high reproducibility within a thickness range of 15 to 30 nm and of a quality suitable also for high resolution transmission electron microscopy.
authors.affiliation: Department of Environmental Medicine, National Institute of Public Health, Torshov, Oslo, Norway. bjorn.johansen@bio.uio.no
authors.forename: B V
authors.initials: BV
authors.lastname: Johansen
authors.forename: H
authors.initials: H
authors.lastname: Ormstad
mesh_terms: D000818:Animals; D002244:Carbon / Q000032:analysis; D005857:Germanium; D006801:Humans; D008854:Microscopy, Electron / Q000295:instrumentation* / Q000379:methods*; D012825:Silicon / Q000032:analysis
chemical_list: D005857:Germanium; D002244:Carbon; D012825:Silicon