Amorphous silicon, flat-panel, x-ray detector versus screen-film radiography: effect of dose reduction on the detectability of cortical bone defects and fractures.
OBJECTIVE
The purpose of this phantom study was to assess the diagnostic performance of a self-scanning, solid-state amorphous silicon (a-Si) detector in skeletal radiography using different exposure parameters.


METHODS
A flat-panel detector (15 cm x 15 cm), based on a-Si technology with 143 microm x 143 microm pixel size, 1k x 1k matrix, and 12 bit digital output was used. State-of-the-art screen-film radiography (SFR; speed 400, detector dose 2.5 microGy) was compared with a-Si images taken at doses that were equivalent to a speed of 400, 800, 1,250, and 1,600, respectively. A total of 232 segments of long tubular deer-bones (femur, tibia, humerus, radius) had 110 artificial fractures and 112 cortical defects simulating osteolytic lesions. Receiver operating characteristic analysis was performed for 9,280 observations made by four independent observers. Two-tailed Student's paired t test was used for statistical analysis (95% confidence level).


RESULTS
Receiver operating characteristic analysis yielded equivalent results of the a-Si and SFR system. Even at the lowest dose there were no statistically significant differences between both imaging modalities with respect to the detectability of fractures and cortical defects.


CONCLUSIONS
The results of this study indicate that a-Si detector technology holds promise in terms of dose reduction in skeletal radiography without loss of diagnostic accuracy.
Strotzer
M
M
Department of Diagnostic Radiology, University Hospital, Regensburg, Germany.
Gmeinwieser
J
J
Spahn
M
M
Völk
M
M
Fründ
R
R
Seitz
J
J
Spies
V
V
Alexander
J
J
Feuerbach
S
S
D000818:Animals; D001842:Bone and Bones / Q000000981:diagnostic imaging*; D003670:Deer; D050723:Fractures, Bone / Q000000981:diagnostic imaging*; D019047:Phantoms, Imaging; D012372:ROC Curve; D011856:Radiographic Image Enhancement / Q000295:instrumentation*; D012825:Silicon; D013679:Technology, Radiologic / Q000295:instrumentation*; D014963:X-Ray Intensifying Screens
D012825:Silicon