title: [Modeling the transport properties of Si,C-resistors for electronic implants based on microscopic material analysis].
authors.affiliation: Zentralinstitut für Biomedizinische Technik, Friedrich-Alexander-Universität Erlangen-Nürnberg.
authors.forename: H
authors.initials: H
authors.lastname: Krätschmer
authors.forename: S
authors.initials: S
authors.lastname: Eck
authors.forename: A
authors.initials: A
authors.lastname: Bolz
authors.forename: M
authors.initials: M
authors.lastname: Schaldach
mesh_terms: D017554:Carbon Compounds, Inorganic; D004553:Electric Conductivity; D006801:Humans; D008855:Microscopy, Electron, Scanning; D019736:Prostheses and Implants; D017655:Silicon Compounds; D013499:Surface Properties
chemical_list: D017554:Carbon Compounds, Inorganic; D017655:Silicon Compounds; C022088:silicon carbide
vernacular_title: Modellierung der Transporteigenschaften von Si,C-Widerständen für elektronische Implantate auf der Basis einer mikroskopischen Materialanalyse.