title: Surface characteristics of gram-negative and gram-positive bacteria in an atomic force microscope image.
abstract: Bacterial images can be obtained rather easily with an atomic-force microscope (AFM) in the magnification range of 5,000 to 30,000 times without any pretreatment of the specimens for such observations as chemical fixation, dehydration or staining. The bacterial shapes or the presence of flagella can be clearly recognized in these magnification ranges. In addition, we were also able to distinguish between gram-negative and gram-positive bacteria based on the specific wavy surface appearance of the former. AFM could thus be a useful tool for the identification of bacteria in the resolution range between electron and light microscopy.
authors.affiliation: Department of Bacteriology, Faculty of Medicine, Kyushu University, Fukuoka, Fukuoka, Japan. umeda@bact.med.kyushu-u.ac.jp
authors.forename: A
authors.initials: A
authors.lastname: Umeda
authors.forename: M
authors.initials: M
authors.lastname: Saito
authors.forename: K
authors.initials: K
authors.lastname: Amako
mesh_terms: D001412:Bacillus subtilis / Q000648:ultrastructure; D004926:Escherichia coli / Q000648:ultrastructure; D005407:Flagella / Q000648:ultrastructure; D006090:Gram-Negative Bacteria / Q000648:ultrastructure*; D006094:Gram-Positive Bacteria / Q000648:ultrastructure*; D018625:Microscopy, Atomic Force; D011514:Proteus vulgaris / Q000648:ultrastructure; D011550:Pseudomonas aeruginosa / Q000648:ultrastructure; D012486:Salmonella typhimurium / Q000648:ultrastructure; D013499:Surface Properties