title: Technique for identification of submicron metal particulate from implants in histological specimens.
abstract: Metal implants are being used with increasing frequency for the treatment of many diseases in the field of orthopedics, cardiology, cardiovascular surgery, and otolaryngology. Unfortunately, metals can be a source of submicron particles, which may have adverse effects on tissues. This article describes a technique that uses backscattered electron imaging and energy dispersive X-ray microanalysis, which have the capacity to perform both quantitative and qualitative analysis. The particles can be characterized by size, shape, amount, and composition. Although this technique can be used near the implant interface, it is particularly helpful in tissues a great distance from the implant site with a low concentration of metal debris. In addition, the sensitivity and specificity of this technique can be adjusted to the investigator's needs.
authors.affiliation: Bone and Joint Research Lab, VA Medical Center, Salt Lake City, Utah 84148, USA.
authors.forename: G A
authors.initials: GA
authors.lastname: Lundeen
authors.forename: K G
authors.initials: KG
authors.lastname: Shea
authors.forename: C
authors.initials: C
authors.lastname: Sanderson
authors.forename: K N
authors.initials: KN
authors.lastname: Bachus
authors.forename: R D
authors.initials: RD
authors.lastname: Bloebaum
mesh_terms: D004577:Electron Probe Microanalysis / Q000379:methods*; D008099:Liver / Q000737:chemistry; D008198:Lymph Nodes / Q000737:chemistry; D008670:Metals / Q000032:analysis*; D019736:Prostheses and Implants; D013154:Spleen / Q000737:chemistry
chemical_list: D008670:Metals