Applications of the FIB lift-out technique for TEM specimen preparation.
A site-specific technique for cross-section transmission electron microscopy specimen preparation of difficult materials is presented. A focused ion beam was used to slice an electron transparent membrane from a specific area of interest within a bulk sample. Micromanipulation lift-out procedures were then used to transport the electron-transparent specimen to a carbon-coated copper grid for subsequent TEM analysis. The FIB (focused ion beam) lift-out technique is a fast method for the preparation of site-specific TEM specimens. The versatility of this technique is demonstrated by presenting cross-sectioned TEM specimens from several types of materials systems, including a multi-layered integrated circuit on a Si substrate, a galvanized steel, a polycrystalline SiC ceramic fiber, and a ZnSe optical ceramic. These specimens have both complex surface geometry and interfaces with complex chemistry. FIB milling was performed sequentially through different layers of cross-sectioned materials so that preferential sputtering was not a factor in preparing TEM specimens. The FIB lift-out method for TEM analysis is a useful technique for the study of complex materials systems for TEM analysis.
Giannuzzi
L A
LA
Department of Mechanical, Materials, & Aerospace Engineering, University of Central Florida, Orlando 32816-2450, USA.
Drown
J L
JL
Brown
S R
SR
Irwin
R B
RB
Stevie
F A
FA
D002516:Ceramics; D008670:Metals; D008854:Microscopy, Electron / Q000379:methods*; D013048:Specimen Handling / Q000379:methods*; D013499:Surface Properties
D008670:Metals