Fourier Transform Emission Spectroscopy of the A2Delta-X2Pi Transition of SiH and SiD.
The emission spectra of the A2Delta-X2Pi transition of SiH and SiD have been observed at high resolution using a Fourier transform spectrometer. The molecules were excited in a Si hollow cathode lamp by passing a discharge through a mixture of Ne and a trace of H2 or D2. The present data, combined with the previous infrared vibration-rotation measurements, have been used to determine improved molecular constants for the ground and excited states of SiH and SiD. Copyright 1998 Academic Press.
Department of Chemistry, University of Arizona, Tucson, Arizona, 85721
RS
Ram
R
Engleman
PF
Bernath