title: Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques.
abstract: The combination of cryo-energy filtering transmission electron microscopy (EFTEM)/electron spectroscopic diffraction (ESD)/electron energy-loss spectroscopy (EELS) and cryo-energy-dispersive X-ray (EDX) analysis in the scanning transmission (STEM) and scanning (SEM) modes was applied for the characterization of composite tabular Ag(Br,I) microcrystals. A low-loss fine structure in EEL spectra between 4 and 26 eV was attributed to excitons and plasmons possibly superimposed with interband transitions and many-electron effects. The contrast tuning under the energy-filtering in the low-loss region was used to image the crystal morphology, defect structure (random dislocations and ¿111¿ stacking faults) and bend and edge contours as well as electron excitations in the microcrystals. Sharp extra reflections at commensurate positions in between the main Bragg reflections and diffuse honeycomb contours in ESD patterns of the microcrystals taken near the [111] zone were assigned to the number of defects in the shell region parallel to the grain edges and polyhedral clusters of interstitial silver cations, respectively. The imaginary part of the energy-loss function, Im (-1/epsilon), and the real and imaginary parts, epsilon1 and epsilon2, of the dielectric permittivity were determined by means of a Kramers-Kronig analysis. An assignment of exciton peaks based on calculations of electronic band structure of silver bromide is proposed. Inner-shell excitation bands of silver halide were detected in line with EDX-analyses. The energy-loss near-edge structure (ELNES) of the AgM4,5-edge governed by spin-orbital splitting between the 3d3/2- and 3d5/2-states has been evaluated. Combined silver and halide distributions were obtained by a three-window method (EFTEM) and by EDX/STEM including area mapping and line profiling of iodide.
authors.affiliation: Micro- and Trace Analysis Center, Department of Chemistry, University of Antwerp (UIA), Wilrijk-Antwerpen, Belgium. oleshko@uia.ua.ac.be
authors.forename: V P
authors.initials: VP
authors.lastname: Oleshko
authors.forename: R H
authors.initials: RH
authors.lastname: Gijbels
authors.forename: A J
authors.initials: AJ
authors.lastname: Van Daele
authors.forename: W A
authors.initials: WA
authors.lastname: Jacob
authors.forename: Y E
authors.initials: YE
authors.lastname: Xu
authors.forename: S E
authors.initials: SE
authors.lastname: Wang
authors.forename: I Y
authors.initials: IY
authors.lastname: Park
authors.forename: T S
authors.initials: TS
authors.lastname: Kang
mesh_terms: D001965:Bromides / Q000737:chemistry; D020285:Cryoelectron Microscopy / Q000379:methods*; D003461:Crystallography / Q000379:methods; D005459:Fluorides / Q000737:chemistry; D007089:Image Enhancement / Q000379:methods; D018030:Silver Compounds / Q000737:chemistry*; D013052:Spectrometry, X-Ray Emission
chemical_list: D001965:Bromides; D018030:Silver Compounds; C105022:silver fluoride; C037548:silver chloride; C047751:silver bromide; D005459:Fluorides