title: Characterization of etch pits and correlated defects in ZnSe/(001)GaAs.
authors.affiliation: Department of Electronics, Nagoya University, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Tanaka
authors.forename: T
authors.initials: T
authors.lastname: Goto
authors.forename: M
authors.initials: M
authors.lastname: Hibino
mesh_terms: D001152:Arsenicals; D005708:Gallium; D008420:Manufactured Materials; D008422:Materials Testing; D008854:Microscopy, Electron; D018036:Selenium Compounds; D017967:Zinc Compounds
chemical_list: D001152:Arsenicals; D018036:Selenium Compounds; D017967:Zinc Compounds; C043055:gallium arsenide; D005708:Gallium