Characterization of etch pits and correlated defects in ZnSe/(001)GaAs.
Tanaka
S
S
Department of Electronics, Nagoya University, Japan.
Goto
T
T
Hibino
M
M
D001152:Arsenicals; D005708:Gallium; D008420:Manufactured Materials; D008422:Materials Testing; D008854:Microscopy, Electron; D018036:Selenium Compounds; D017967:Zinc Compounds
D001152:Arsenicals; D018036:Selenium Compounds; D017967:Zinc Compounds; C043055:gallium arsenide; D005708:Gallium