title: Hot-electron transport through Au/GaAs and Au/GaAs/AlAs heterojunction interfaces: Ballistic-electron-emission-microscopy measurement and Monte Carlo simulation.
authors.initials: Ml
authors.lastname: Ke
authors.initials: DI
authors.lastname: Westwood
authors.initials: CC
authors.lastname: Matthai
authors.initials: BE
authors.lastname: Richardson
authors.initials: RH
authors.lastname: Williams