Applications of focused ion beam systems in gunshot residue investigation.
Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.
Niewöhner
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Forensic Science Institute of the Bundeskriminalamt, Wiesbaden, Germany.
Wenz
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HW
D005389:Firearms; D005554:Forensic Medicine / Q000379:methods; D006801:Humans; D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods*; D014948:Wounds, Gunshot / Q000473:pathology*