title: Applications of focused ion beam systems in gunshot residue investigation.
abstract: Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.
authors.affiliation: Forensic Science Institute of the Bundeskriminalamt, Wiesbaden, Germany.
authors.forename: L
authors.initials: L
authors.lastname: Niewöhner
authors.forename: H W
authors.initials: HW
authors.lastname: Wenz
mesh_terms: D005389:Firearms; D005554:Forensic Medicine / Q000379:methods; D006801:Humans; D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods*; D014948:Wounds, Gunshot / Q000473:pathology*