Electron-impact ionization and energy loss of 27-MeV/u Xe35+ incident ions channeled in silicon.
S
Andriamonje
R
Anne
de Castro Faria NV
M
Chevallier
C
Cohen
J
Dural
MJ
Gaillard
R
Genre
M
Hage-Ali
R
Kirsch
A
L'Hoir
B
Farizon-Mazuy
J
Mory
J
Moulin
JC
Poizat
Y
Quéré
J
Remillieux
D
Schmaus
M
Toulemonde