Electron-impact ionization and energy loss of 27-MeV/u Xe35+ incident ions channeled in silicon.
Andriamonje
S
Anne
R
de Castro Faria NV
Chevallier
M
Cohen
C
Dural
J
Gaillard
MJ
Genre
R
Hage-Ali
M
Kirsch
R
L'Hoir
A
Farizon-Mazuy
B
Mory
J
Moulin
J
Poizat
JC
Quéré
Y
Remillieux
J
Schmaus
D
Toulemonde
M