title: A slit-lamp eyepiece micrometer calibrated at 50-micron intervals.
abstract: Measurements of dimensions of various intraocular structures, both normal and abnormal, are both theoretically and clinically useful. The currently available standard Haag-Streit slit-lamp micrometer eyepiece is calibrated at 100 micron intervals. In order to achieve greater precision in measurement of smaller intraocular structures, the authors and Haag-Streit, Inc. (Kaniz, Switzerland) have developed an eyepiece calibrated in 50-micron intervals.
authors.affiliation: Department of Ophthalmology, The New York Eye and Ear Infirmary, NY 10003, USA.
authors.forename: R
authors.initials: R
authors.lastname: Ritch
authors.forename: R
authors.initials: R
authors.lastname: Galvão-Filho
authors.forename: J M
authors.initials: JM
authors.lastname: Liebmann
mesh_terms: D002138:Calibration; D004867:Equipment Design; D006801:Humans; D019721:Ophthalmoscopes; D009887:Ophthalmoscopy