title: Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes.
abstract: : With the ultrahigh vacuum variable-temperature scanning tunneling microscope (UHV-VT-STM), atomic-level observation has been achieved. An ultrahigh vacuum atomic force microscope (UHV-AFM) has also been developed, with success in obtaining atom images where observation in noncontact (NC) mode with a frequency modulation (FM) detection method was attempted. Using the FM detection method in the constant oscillation amplitude of the cantilever excitation mode, we have obtained atomic-resolution images of Si(111) 7 x 7 structures and Si(100) 2 x 1 structures and other structures together with STM images in an ultrahigh vacuum environment. Also shown here are contact potential difference (CPD) images using the NC-AFM method.
authors.affiliation: Electron Optics Division, JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan
authors.initials: M
authors.lastname: Iwatsuki
authors.initials: K
authors.lastname: Suzuki
authors.initials: S
authors.lastname: Kitamura
authors.initials: M
authors.lastname: Kersker