Secondary ion yields produced by keV atomic and polyatomic ion impacts on a self-assembled monolayer surface
A suite of keV polyatomic or 'cluster' projectiles was used to bombard unoxidized and oxidized self-assembled monolayer surfaces. Negative secondary ion yields, collected at the limit of single ion impacts, were measured and compared for both molecular and fragment ions. In contrast to targets that are orders of magnitude thicker than the penetration range of the primary ions, secondary ion yields from polyatomic projectile impacts on self-assembled monolayers show little to no enhancement when compared with monatomic projectiles at the same velocity. This unusual trend is most likely due to the structural arrangement and bonding characteristics of the monolayer molecules with the Au(111). Copyright 1999 John Wiley & Sons, Ltd.
Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USA.
RD
Harris
WS
Baker
Van Stipdonk MJ
RM
Crooks
EA
Schweikert