A method for characterizing longitudinal chromatic aberration of microscope objectives using a confocal optical system
We describe a novel method of characterizing the longitudinal chromatic aberration of microscope objectives by recording a series of axial responses as a function of wavelength as a plane reflector is scanned through the focal region of a confocal microscope. Measurements are presented for a variety of objectives with differing degrees of correction. The use of the chromatic focal shift to measure surface profiles is also discussed.
Juskaitis
R
Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, U.K.
Wilson
T