Use of quantitative convergent-beam electron diffraction in materials science.
Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non-centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.
Holmestad
R
R
Department of Physics, Norwegian University of Science and Technology (NTNU), N-7491 Trondheim, Norway. randih@phys.ntnu.no
Birkeland
C R
CR
Marthinsen
K
K
Høier
R
R
Zuo
J M
JM
D000497:Alloys; D008422:Materials Testing; D008670:Metals; D008854:Microscopy, Electron / Q000295:instrumentation* / Q000379:methods*; D012666:Semiconductors
D000497:Alloys; D008670:Metals