title: Use of quantitative convergent-beam electron diffraction in materials science.
abstract: Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non-centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.
authors.affiliation: Department of Physics, Norwegian University of Science and Technology (NTNU), N-7491 Trondheim, Norway. randih@phys.ntnu.no
authors.forename: R
authors.initials: R
authors.lastname: Holmestad
authors.forename: C R
authors.initials: CR
authors.lastname: Birkeland
authors.forename: K
authors.initials: K
authors.lastname: Marthinsen
authors.forename: R
authors.initials: R
authors.lastname: Høier
authors.forename: J M
authors.initials: JM
authors.lastname: Zuo
mesh_terms: D000497:Alloys; D008422:Materials Testing; D008670:Metals; D008854:Microscopy, Electron / Q000295:instrumentation* / Q000379:methods*; D012666:Semiconductors
chemical_list: D000497:Alloys; D008670:Metals