title: Integrative metabolic effect of risk factors and the pathogenesis of insulin resistance. (theoretic speculations and therapeutic corollaries).
abstract: This paper analyses theoretically insulin post-receptor resistance caused by risk factors (RFs)--obesity, energy over-load, low physical activity, stress. Each of these RFs is capable of producing abnormalities directly or indirectly in glucose and lipid metabolism solely or in combination with the others. The RFs pathogenic integration forms in each patient an individual kind of pathogenic integral (PI) which becomes pathogenic because of RFs' pathogenic power summation. Sulfonylurea therapy may increase insulin resistance and become a part of PI. Waiting for perfect medicine, the intensive clinical treatment of RFs seems to be the most reasonable behavior in NIDD.
authors.affiliation: Department of Pathophysiology, Faculty of Medicine, Thracian University, Stara Zagora.
authors.forename: G
authors.initials: G
authors.lastname: Sarov
mesh_terms: D004734:Energy Metabolism; D015444:Exercise; D006801:Humans; D007333:Insulin Resistance; D009765:Obesity; D012307:Risk Factors; D013312:Stress, Physiological