title: A capacitance standard based on counting electrons
abstract: A capacitance standard based directly on the definition of capacitance was built. Single-electron tunneling devices were used to place N electrons of charge e onto a cryogenic capacitor C, and the resulting voltage change DeltaV was measured. Repeated measurements of C = Ne/DeltaV with this method have a relative standard deviation of 0.3 x 10(-6). This standard offers a natural basis for capacitance analogous to the Josephson effect for voltage and the quantum Hall effect for resistance.
authors.affiliation: National Institute of Standards and Technology, Boulder, CO 80303, USA. National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
authors.initials: MW
authors.lastname: Keller
authors.initials: AL
authors.lastname: Eichenberger
authors.initials: JM
authors.lastname: Martinis
authors.initials: NM
authors.lastname: Zimmerman