title: Combined ultramicrotomy for AFM and TEM using a novel sample holder.
abstract: A new sample holder that allows combined microtomy for atomic force microscopy (AFM) and transmission electron microscopy (TEM) is described. The main feature of this sample holder is a small central part holding the sample. This central part fits into the head of an atomic force microscope. AFM measurements can be performed with a sample mounted in this central part of the sample holder. This makes the alignment of a microtomed bulk sample unnecessary, and offers the opportunity of an easy and fast combined sample preparation for AFM and TEM.
authors.affiliation: Freiburger Materialforschungszentrum und Institut für Makromolekulare Chemie, Albert-Ludwigs-Universität Freiburg, Stefan-Meier-Str. 21, D-79104 Freiburg/Brsg., Germany.
authors.forename: Y
authors.initials: Y
authors.lastname: Thomann
authors.forename: R
authors.initials: R
authors.lastname: Thomann
authors.forename: G
authors.initials: G
authors.lastname: Bar
authors.forename: M
authors.initials: M
authors.lastname: Ganter
authors.forename: B
authors.initials: B
authors.lastname: MacHutta
authors.forename: R
authors.initials: R
authors.lastname: Mülhaupt
mesh_terms: D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D008854:Microscopy, Electron / Q000295:instrumentation*; D008867:Microtomy / Q000295:instrumentation*