Combined ultramicrotomy for AFM and TEM using a novel sample holder.
A new sample holder that allows combined microtomy for atomic force microscopy (AFM) and transmission electron microscopy (TEM) is described. The main feature of this sample holder is a small central part holding the sample. This central part fits into the head of an atomic force microscope. AFM measurements can be performed with a sample mounted in this central part of the sample holder. This makes the alignment of a microtomed bulk sample unnecessary, and offers the opportunity of an easy and fast combined sample preparation for AFM and TEM.
Thomann
Y
Y
Freiburger Materialforschungszentrum und Institut für Makromolekulare Chemie, Albert-Ludwigs-Universität Freiburg, Stefan-Meier-Str. 21, D-79104 Freiburg/Brsg., Germany.
Thomann
R
R
Bar
G
G
Ganter
M
M
MacHutta
B
B
Mülhaupt
R
R
D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D008854:Microscopy, Electron / Q000295:instrumentation*; D008867:Microtomy / Q000295:instrumentation*