title: Novel approaches to the analysis of polysaccharide structures.
abstract: Recently, atomic force microscopy has been used to image a variety of polysaccharides and map their distribution on cell surfaces. The mechanical response of polysaccharides to tensile stress has been investigated in single-molecule force spectroscopy experiments. Small-angle X-ray scattering has provided a probe of polysaccharide structure operating in a size range (2-25 nm) that is intermediate between those accessible using nuclear magnetic resonance and light scattering.
authors.affiliation: Department of Chemistry, University of California, Irvine, CA 92697-2025, USA. dbrant@uci.edu
authors.forename: D A
authors.initials: DA
authors.lastname: Brant
mesh_terms: D002236:Carbohydrate Conformation; D018625:Microscopy, Atomic Force / Q000379:methods; D011134:Polysaccharides / Q000737:chemistry* / Q000648:ultrastructure; D014961:X-Ray Diffraction / Q000379:methods
chemical_list: D011134:Polysaccharides