title: Combinatorial materials synthesis and high-throughput screening: an integrated materials chip approach to mapping phase diagrams and discovery and optimization of functional materials.
abstract: Combinatorial materials synthesis methods and high-throughput evaluation techniques have been developed to accelerate the process of materials discovery and optimization and phase-diagram mapping. Analogous to integrated circuit chips, integrated materials chips containing thousands of discrete different compositions or continuous phase diagrams, often in the form of high-quality epitaxial thin films, can be fabricated and screened for interesting properties. Microspot x-ray method, various optical measurement techniques, and a novel evanescent microwave microscope have been used to characterize the structural, optical, magnetic, and electrical properties of samples on the materials chips. These techniques are routinely used to discover/optimize and map phase diagrams of ferroelectric, dielectric, optical, magnetic, and superconducting materials.
authors.affiliation: Mail-Stop: 2-300, One Cyclotron Road, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
authors.forename: X D
authors.initials: XD
authors.lastname: Xiang
mesh_terms: D020650:Combinatorial Chemistry Techniques / Q000379:methods*; D004581:Electronics; D008280:Magnetics; D008422:Materials Testing; D008853:Microscopy / Q000295:instrumentation; D008872:Microwaves; D055095:Optics and Photonics / Q000295:instrumentation