title: [Single molecule analysis with noncontact atomic force microscopy (NC-AFM)].
authors.affiliation: Department of Electronic Engineering, Graduate School of Engineering, Osaka University, Japan. sugawara@ele.eng.osaka-u.ac.jp
authors.forename: Y
authors.initials: Y
authors.lastname: Sugawara
authors.forename: S
authors.initials: S
authors.lastname: Morita
mesh_terms: D001671:Biochemistry / Q000379:methods*; D055598:Chemical Phenomena; D002627:Chemistry, Physical; D018625:Microscopy, Atomic Force; D017422:Sequence Analysis, DNA