Combined scanning electrochemical-atomic force microscopy.
A combined scanning electrochemical microscope (SECM)-atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM-AFM, have been fabricated by coating flattened and etched Pt microwires with insulating, electrophoretically deposited paint. The flattened portion of the probe provides a flexible cantilever (force sensor), while the coating insulates the probe such that only the tip end (electrode) is exposed to the solution. The SECM-AFM technique is illustrated with simultaneous electrochemical-probe deflection approach curves, simultaneous topographical and electrochemical imaging studies of track-etched polycarbonate ultrafiltration membranes, and etching studies of crystal surfaces.
Macpherson
J V
JV
Department of Chemistry, University of Warwick, Coventry, U.K.
Unwin
P R
PR
D004563:Electrochemistry / Q000295:instrumentation*; D008567:Membranes, Artificial; D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D008855:Microscopy, Electron, Scanning; D014462:Ultrafiltration / Q000295:instrumentation
D008567:Membranes, Artificial