title: Influence of topography and specimen preparation on backscattered electron images of bone.
abstract: Backscattered electron (BSE) images of bone exhibit graylevel contrast between adjacent lamellae. Mathematical models suggest that interlamellar contrast in BSE images is an artifact due to topographic irregularities. However, little experimental evidence has been published to support these models, and it is not clear whether submicron topographical features will alter BSE graylevels. The goal of this study was to determine the effects of topography on BSE image mean graylevels and graylevel histogram widths using conventional specimen preparation techniques. White-light interferometry and quantitative BSE imaging were used to investigate the relationship between the BSE signal and specimen roughness. Backscattered electron image graylevel histogram widths correlated highly with surface roughness in rough preparations of homogeneous materials. The relationship between BSE histogram width and surface roughness was specimen dependent. Specimen topography coincided with the lamellar patterns within the bone tissue. Diamond micromilling reduced average surface roughness when compared with manual polishing techniques but did not significantly affect BSE graylevel histogram width. The study suggests that topography is a confounding factor in quantitative BSE analysis of bone. However, there is little quantitative difference between low-to-moderate magnification BSE images of bone specimens prepared by conventional polishing or diamond micromilling.
authors.affiliation: Bone and Joint Research Laboratory, VA Medical Center, Salt Lake City, Utah 84148, USA.
authors.forename: E G
authors.initials: EG
authors.lastname: Vajda
authors.forename: S
authors.initials: S
authors.lastname: Humphrey
authors.forename: J G
authors.initials: JG
authors.lastname: Skedros
authors.forename: R D
authors.initials: RD
authors.lastname: Bloebaum
mesh_terms: D000818:Animals; D015519:Bone Density; D003670:Deer; D006736:Horses; D006801:Humans; D008854:Microscopy, Electron