Dissociation study of tellurium cluster ions, Te(n)(+) (n = 25-85) using secondary ion mass spectrometry.
Dissociation pathways of tellurium clusters, Te(n)(+) (n = 25-85), were investigated by secondary ion mass spectrometry. Positively charged ions were generated from a tellurium sheet by bombardment with 10 keV xenon ion beam. Mass analyses of cluster ions were performed using a grand-scale sector mass spectrometer. In the first field-free region, Te(n)(+) (n = 25-80) had a large dissociation probability with five- and six-atom emission and Te(n)(+) (n = 50-85) had a slightly large dissociation probability with 10- and 11-atom emission. Five- and six-atom dissociation in the second field-free region could be also observed. These results were most likely due to the cluster emission processes for Te(n)(+), although sequential atom emission and cluster emission could not be distinguished by this type of experiments.
Ito
H
H
Department of Physics, Graduate School of Science, Osaka University, Machikaneyama 1-16, Toyonaka Osaka 560-0043, Japan. ito@phys.wani.osaka-u.ac.jp
Matsuo
T
T
Sato
T
T
Ichiharai
T
T
Katakuse
I
I
D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods*; D013691:Tellurium / Q000737:chemistry*
D013691:Tellurium