title: Channel noise in neurons.
abstract: The probabilistic gating of voltage-dependent ion channels is a source of electrical 'channel noise' in neurons. This noise has long been implicated in limiting the reliability (repeatability) of neuronal responses to repeated presentations of identical stimuli. More recently, it has been shown to increase the range of spiking behaviors exhibited in some neural populations. Channel numbers are tied to metabolic efficiency and the stability of resting potential, and channel noise might be exploited by future cochlear implants in order to improve the temporal representation of sound.
authors.affiliation: Dept of Biomedical Engineering and Center for BioDynamics, Boston University, Boston, MA 02215, USA.
authors.forename: J A
authors.initials: JA
authors.lastname: White
authors.forename: J T
authors.initials: JT
authors.lastname: Rubinstein
authors.forename: A R
authors.initials: AR
authors.lastname: Kay
mesh_terms: D000200:Action Potentials / Q000502:physiology; D000818:Animals; D001369:Axons / Q000502:physiology; D003054:Cochlear Implants; D004558:Electric Stimulation; D006801:Humans; D015640:Ion Channel Gating / Q000502:physiology*; D007473:Ion Channels / Q000502:physiology; D008959:Models, Neurological; D009474:Neurons / Q000166:cytology / Q000502:physiology*; D015203:Reproducibility of Results; D013269:Stochastic Processes; D009435:Synaptic Transmission / Q000502:physiology
chemical_list: D007473:Ion Channels