Electron microscopy of reverse biased p-n junctions
The aim of this paper is to present and discuss the recent results obtained in the investigation of reverse-biased p-n junctions by means of the out-of-focus method. It will be shown how the interpretation of the experimental images is not in agreement with the expectations based on the bulk p-n junction theory. The possible causes of this discrepancy will be discussed: among them a significant reason could be the finite specimen thickness with the associated surface states, which influences the width and shape of the depletion layer in the thinned specimen.
Beleggia
M
Department of Physics, University of Bologna, Italy.
Cristofori
D
Merli
PG
Pozzi
G