Whisker probes
A new technology for preparation of AFM probes based on whiskers is proposed. The technology posseses significant advantages to the whisker probes over standard ones as related to the shapes of the probes, as well as to the properties of the cantilevers on which the whiskers are grown.
Givargizov
EI
Institute of Crystallography, Russian Academy of Sciences, Moscow. givargiz@cvdlab.incr.msk.su
Stepanova
AN
Obolenskaya
LN
Mashkova
ES
Molchanov
VA
Givargizov
ME
Rangelow
IW