title: Personal fluoride and solvent exposures, and their determinants, in semiconductor manufacturing.
abstract: Personal air sampling for fluorides and solvents was done at 35 semiconductor fabrication facilities in the United States. Fluoride compounds were used in etching and cleaning operations, and solvents were used in photoresist and developing operations. All personal solvent and fluoride levels were less than 2 percent of current Occupational Safety and Health Administration (OSHA) standards. Statistical models of the exposure determinants for the target agents found production level, as indicated by number of semiconductor wafer cassettes loaded/unloaded from the target machines or baths, was predictive of fluoride, xylene and 1-methoxy-2-propyl acetate exposures. The percent of fresh air ventilation and the percent of xylene in the photoresist were also significant determinants in the statistical model predicting personal xylene exposure levels.
authors.affiliation: Department of Work Environment, University of Massachusetts Lowell, USA.
authors.forename: S R
authors.initials: SR
authors.lastname: Woskie
authors.forename: S K
authors.initials: SK
authors.lastname: Hammond
authors.forename: C J
authors.initials: CJ
authors.lastname: Hines
authors.forename: M F
authors.initials: MF
authors.lastname: Hallock
authors.forename: E
authors.initials: E
authors.lastname: Kenyon
authors.forename: M B
authors.initials: MB
authors.lastname: Schenker
mesh_terms: D000395:Air Pollutants, Occupational / Q000032:analysis*; D002617:Chemical Industry; D004784:Environmental Monitoring; D005459:Fluorides / Q000032:analysis*; D006801:Humans; D015233:Models, Statistical; D009314:National Institute for Occupational Safety and Health, U.S.; D016273:Occupational Exposure / Q000032:analysis*; D012044:Regression Analysis; D012494:Sampling Studies; D012666:Semiconductors; D012997:Solvents / Q000032:analysis*; D014481:United States
chemical_list: D000395:Air Pollutants, Occupational; D012997:Solvents; D005459:Fluorides