title: Valence state mapping of cobalt and manganese using near-edge fine structures
abstract: The properties of transition metal oxides are related to the presence of elements with mixed valences. The spectroscopy analysis of the valence states is feasible experimentally, but a spatial mapping of valence states of transition metal elements is a challenge to existing microscopy techniques. In this paper, with the use of valence state information provided by the white lines and near-edge fine structures observed using the electron energy-loss spectroscopy (EELS) in a transmission electron microscope (TEM), a novel experimental approach is demonstrated to map the valence state distributions of Mn and Co using the ratio of white lines in the energy-filtered TEM. The valence state map is almost independent of specimen thickness in the thickness range adequate for quantitative EELS microanalysis. An optimum spatial resolution of approximately 2 nm has been achieved for a two-phase Co oxides.
authors.affiliation: School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta 30332-0245, USA. zhong.wang@mse.gatech.edu
authors.initials: ZL
authors.lastname: Wang
authors.initials: J
authors.lastname: Bentley
authors.initials: ND
authors.lastname: Evans