Exit wave reconstructions using through focus series of HREM images.
The through focus exit wave reconstruction technique uses a series of high resolution electron microscopy images to reconstruct the complex electron wavefunction at the exit plane of the specimen. The feasibility of the through focus exit wave reconstruction method and its most important limitations are discussed. It is shown that-provided all aberrations of the microscope are well corrected for-a large improvement in the interpretability of the information can be obtained.
Zandbergen
H W
HW
National Centre for HREM, Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands.
Van Dyck
D
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D055592:Biophysical Phenomena; D001703:Biophysics; D003198:Computer Simulation; D019277:Entropy; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D017633:Magnesium Silicates; D008854:Microscopy, Electron / Q000379:methods*; D008962:Models, Theoretical
D017633:Magnesium Silicates; C005013:Florisil