Limitations of interferometry due to the flicker noise of laser diodes
Interferometry with laser diodes is a cost-effective way to perform displacement measurement. The tunability of laser diodes is also of great interest in multiple-wavelength interferometry. However, the additional flicker noise in the frequency-noise spectrum of semiconductor lasers may become a limiting factor. Investigations on the limitations due to the 1/f noise of laser diodes are presented for both classical and multiple-wavelength interferometry. Measurements at the limit of the coherence length of laser diodes with the corresponding phase fluctuations are reported. The theoretical results are verified experimentally.
Salvade
Y
Institute of Microtechnology, University of Neuchatel, Switzerland. yves.salvade@imt.unine.ch
Dandliker
R