Quantitative determination of contact stiffness using atomic force acoustic microscopy
Atomic force acoustic microscopy is a near-field technique which combines the ability of ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We present a technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively, with a resolution of approximately 20 nm, exploiting the contact resonance frequencies of standard cantilevers used in atomic force microscopy. The Young's modulus of nanocrystalline ferrite films has been measured as a function of oxidation temperature. Furthermore, images showing the domain structure of piezoelectric lead zirconate titanate ceramics have been taken.
Rabe
U
Fraunhofer Institute for Nondestructive Testing (IZFP), Saarbrucken, Germany. rabe@izfp.fhg.de
Amelio
S
Kester
E
Scherer
V
Hirsekorn
S
Arnold
W