title: Facilitated tip-positioning and applications of non-electrode tips in scanning electrochemical microscopy using a shear force based constant-distance mode.
abstract: In scanning electrochemical microscopy (SECM) a microelectrode is usually scanned over a sample without following topographic changes (constant-height mode). Therefore, deconvolution of effects from distance variations arising from non-flat sample surface and electrochemical surface properties is in general not possible. Using a shear force-based constant distance mode, information about the morphology of a sample and its localized electrochemical activity can be obtained simultaneously. The setup of the SECM with integrated constant-distance mode and its application to non-flat or tilted surfaces, as well as samples with three-dimensional surface structures are presented and discussed. The facilitated use of non-amperometric tips in SECM like enzyme-filled glass capillaries is demonstrated.
authors.affiliation: Analytische Chemie, Elektroanalytik und Sensorik Ruhr-Universität Bochum, Germany.
authors.forename: A
authors.initials: A
authors.lastname: Hengstenberg
authors.forename: C
authors.initials: C
authors.lastname: Kranz
authors.forename: W
authors.initials: W
authors.lastname: Schuhmann
mesh_terms: D004563:Electrochemistry; D042843:Glucose 1-Dehydrogenase; D005948:Glucose Dehydrogenases / Q000737:chemistry; D005949:Glucose Oxidase / Q000737:chemistry; D007834:Lasers; D008854:Microscopy, Electron / Q000295:instrumentation / Q000379:methods*; D009243:NAD / Q000737:chemistry; D010084:Oxidation-Reduction
chemical_list: D009243:NAD; D005948:Glucose Dehydrogenases; D042843:Glucose 1-Dehydrogenase; D005949:Glucose Oxidase