title: SIMS of organic anions adsorbed onto an aminoethanethiol self-assembled monolayer: an approach for enhanced secondary ion emission
abstract: Secondary ion mass spectrometry (SIMS) was used to monitor the uptake of organic anions from solution by aminoethanethiol (AET) monolayers on Au substrates, as a test of the applicability of this monolayer as a substrate for organic SIMS analysis. Event-by-event bombardment and detection mode coupled with coincidence counting allowed the atomic and polyatomic projectile impacts on a particular sample surface to be compared simultaneously and under the same experimental conditions. The mass spectra produced from the monolayer surface and those from Au and Si blanks demonstrate that the AET monolayer is important to the uptake of the organic anion. The exchanged monolayer surfaces were used to measure secondary ion yields, defined as the number of secondary ions detected per incident primary ion, produced from ultrathin films by (CsI)nCs+ (n = 0-2) projectiles at the limit of single-ion impacts. The yield of a tetradecyl sulfate (IDS) anion was improved by a factor of 200 using the AET substrate instead of the thick salt target. The intact ion and fragment ion yield trends produced from the AET surface were measured as a function of number of atoms in the primary projectile and energy. We observed a yield increase for both the intact ion and the fragment ion with the projectile complexity and energy. The increase in yield per projectile atom was linear for the emission of intact TDS and intact dodecyl sulfate from the AET surfaces. A supralinear yield enhancement, however, was observed for the fragment ion SO3- when the three-atom (CsI)Cs+ cluster was used. The experiments demonstrate that the various organosulfate and suffonates are weakly bound to the AET surface and their adsorption to the AET monolayer is reversible. The utility of the AET monolayer on Au was also tested as a general substrate for the characterization of derivatized organic molecules with biological and industrial importance by TOF-SIMS.
authors.affiliation: Department of Chemistry, Texas A&M University, College Station 77843-3012, USA.
authors.lastname: Van Stipdonk MJ
authors.initials: RD
authors.lastname: English
authors.initials: EA
authors.lastname: Schweikert