title: Trace chemical characterization using monochromatic X-ray undulator radiation
abstract: An efficient Johansson-type X-ray fluorescence spectrometer has been developed for advanced X-ray spectroscopic analysis with third-generation synchrotron radiation. Kalpha and Kbeta X-ray fluorescence spectra for trace metals have been collected by a Ge(220) analyzing crystal with a Rowland radius of 150 mm, under monochromatic X-ray excitation at the undulator beamline at the SPring-8. The energy resolution is approximately 10 eV for most of the K lines for 3d transition metals. In light of the greatly improved efficiency, as well as the excellent signal-to-background ratio, the relative and absolute detection limits achieved are 1 ppm and 1.2 ng of copper in a carbon matrix, respectively. The energy resolution of the present spectrometer permits the observation of some chemical effects in Kbeta spectra. It has been demonstrated that the changes in Kbeta5 and Kbeta'' intensity for iron and cobalt compounds can be used for the analysis of chemical states. Resonant X-ray fluorescent spectra are another important application of monochromatic excitation. In view of trace chemical characterization, the present spectrometer can be a good alternative to a conventional Si(Li) detector system when combined with highly brilliant X-rays.
authors.affiliation: National Research Institute for Metals, Ibaraki, Japan.
authors.initials: H
authors.lastname: Eba
authors.initials: C
authors.lastname: Numako
authors.initials: J
authors.lastname: Iihara
authors.initials: K
authors.lastname: Sakurai