Automated identification of symmetry in CBED patterns: a genetic approach
The genetic algorithm has been applied for automated identification of symmetry in CBED patterns. A normalized inner product between an original and its symmetry operated CBED patterns was found to be a good measure of similarity between them, and this inner product was used as the objective function in the genetic algorithm. A real floating number implementation of this genetic approach has been applied successfully in identifying rotation axes and mirror planes in experimental CBED patterns obtained from a single crystal of silicon. In particular a three-fold rotation axis reflecting the true three-dimensional symmetry of silicon is clearly distinguished from a six-fold rotation axis as expected from a two-dimensional crystal in the experimental <1 1 1> zone axis CBED pattern.
Hu
GB
Beijing Laboratory of Electron Microscopy, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, People's Republic of China.
Peng
LM
Yu
QF
Lu
HQ