title: Microscopy of Metal Oxide Surfaces.
abstract: Elevated temperature scanning tunneling microscopy is used to study oxides that are room temperature insulators but become sufficiently electrically conducting at higher temperatures to allow imaging to be performed. Atomic resolution images of NiO, CoO, and UO(2) have been obtained in this fashion which allow surface structure and defect determination. To complement the experiments, modeling of the electronic surface structure reveals which atomic sites give rise to the contrast observed in the images. Low voltage scanning electron microscopy is used to image small equilibrium pores in UO(2) single crystals to evaluate the surface energy ratio of the (111) to (001) surfaces.
authors.affiliation: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
authors.forename: M R
authors.initials: MR
authors.lastname: Castell
authors.forename: S L
authors.initials: SL
authors.lastname: Dudarev
authors.forename: C
authors.initials: C
authors.lastname: Muggelberg
authors.forename: A P
authors.initials: AP
authors.lastname: Sutton
authors.forename: G A
authors.initials: GA
authors.lastname: Briggs
authors.forename: D T
authors.initials: DT
authors.lastname: Goddard