Field Emission and Electron Microscopy.
An overview and new results are presented of the investigations carried out in the last 5 years on nano-sized tips by means of electron microscopy, an electron optical bench, and computation. Tungsten and, in particular, carbon nano-tips prepared by carbon contamination in a scanning electron microscope, were studied for applications as field-emission electron sources. Several features of their use are described and the results concerning the determination of some of their basic properties are reported.
Edgcombe
C J
CJ
Cavendish Laboratory, Department of Physics, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK
Valdrè
U
U