Identification of a new trace 114R SiC by HREM.
Using electron diffraction patterns and high-resolution electron microscopy (HREM), a trace 114R SiC in commercial alpha-SiC powder (mainly 6H SiC according to X-ray diffraction) has been discovered. In a hexagonal unit cell its stacking sequence is [(33)(4)(34)(2)](3), the periodicity along the c axis is 286.14 Å and a = b = 3.073 Å. 114R belongs to the structure series of (33)()n34(33)()m34 predicted theoretically by Pandey & Krishna [Mater. Sci. Eng. (1975), 20, 243-249] on the basis of the faulted matrix model.
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, The Chinese Academy of Sciences, Shenyang 110015, People's Republic of China, and Department of Electronic Science and Engineering, Liaoning University, Shenyang 110036, People's Republic of China. lais@imr.ac.cn
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Yang
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