Three-wave X-ray diffraction: an analysis scheme of the sensitivity in determining triplet phase invariants.
A model for analysing the phase sensitivity of the reflection coefficients of a diffracted wave in the case of three-wave X-ray diffraction is proposed. This model considers three-wave diffraction as the interference of the directly excited and the Umweg-excited diffracted waves and seems to account properly for the phase sensitivity as well as the behaviour of an involved diffracted wave as a function of the triplet phase invariant, the polarization state of the incident wave and the diffraction geometry. The practical issues for phase determination are also considered.
Department of Physics, National Tsing Hua University, Hsinchu, Taiwan 30043, and Chernovtsy State University, Chernovtsy 274012, Ukraine. stetsko@phys.nthu.edu.tw
YP
Stetsko
SL
Chang