title: Hot-electron effects in two-dimensional hopping with a large localization length
abstract: We have studied nonlinear effects in the resistance of a two-dimensional system with a large localization length on both sides of the crossover from weak to strong localization. It is shown that nonlinearity in the hopping regime is due to electron overheating rather than the field effects. This qualitatively new behavior is a signature of a two-dimensional hopping transport with a large localization length.
authors.affiliation: Serin Physics Laboratory, Rutgers University, Piscataway, New Jersey 08854-8019, USA.
authors.initials: ME
authors.lastname: Gershenson
authors.initials: YB
authors.lastname: Khavin
authors.initials: D
authors.lastname: Reuter
authors.initials: P
authors.lastname: Schafmeister
authors.initials: AD
authors.lastname: Wieck