Peculiarities of imaging one- and two-dimensional structures in an emission electron microscope. 1. theory
Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials.
Nepijko
SA
Institut fur Physik, Johannes Gutenberg-Universitat Mainz, Staudingerweg 7, 55099 Mainz, Germany; Institute of Physics, National Academy of Sciences of Ukraine, pr. Nauki 46, 03650 Kiev, CIS/Ukraine; The Moscow Military Institute, Go.
Sedov
NN
Ziethen
C
Schonhense
G
Merkel
M
Escher
M