Electronic absorption and Raman resonance scattering of spectroscopically pure SiO2.
An ultraviolet absorption, as well as Stokes and anti-Stokes Raman resonance scattering of spectroscopically pure SiO2 was investigated by flash photolysis technique. The whole spectrum of 'absorption and scattered bands' was recorded photographically in ultraviolet. A resonance absorption line was observed at 288.2 nm, without structure, while scattered lines were observed at 285-288.2 and 288.2-290 nm.
Yaman
A
A
Department of Physics, Ankara University, Tandogan,Turkey. ayaman@science.ankara.edu.tr
Bayrakçeken
A B
AB
Demir
O J
OJ
Bayrakçeken
F
F
D012822:Silicon Dioxide / Q000737:chemistry*; D013055:Spectrophotometry, Infrared / Q000379:methods*; D013059:Spectrum Analysis, Raman / Q000379:methods*
D012822:Silicon Dioxide