title: Robust parametric and semi-parametric spot fitting for spot array images.
abstract: In this paper we address the problem of reliably fitting parametric and semi-parametric models to spots in high density spot array images obtained in gene expression experiments. The goal is to measure the amount of label bound to an array element. A lot of spots can be modelled accurately by a Gaussian shape. In order to deal with highly overlapping spots we use robust M-estimators. When the parametric method fails (which can be detected automatically) we use a novel, robust semi-parametric method which can handle spots of different shapes accurately. The introduced techniques are evaluated experimentally.
authors.affiliation: Vienna University of Technology, Pattern Recognition and Image Processing Group. nob@prip.tuwien.ac.at
authors.forename: N
authors.initials: N
authors.lastname: Brändle
authors.forename: H Y
authors.initials: HY
authors.lastname: Chen
authors.forename: H
authors.initials: H
authors.lastname: Bischof
authors.forename: H
authors.initials: H
authors.lastname: Lapp
mesh_terms: D000818:Animals; D020869:Gene Expression Profiling / Q000379:methods*; D006801:Humans; D007091:Image Processing, Computer-Assisted; D020411:Oligonucleotide Array Sequence Analysis / Q000379:methods*