Direct measurement of transverse coherence length of hard X rays from interference fringes
We propose a simple interferometric technique for hard x-ray spatial coherence characterization, recording a Fresnel interference pattern produced by a round fiber or a slit. We have derived analytical formulas that give a direct relation between a visibility of interference fringes and either the source size or the transverse coherence length. The technique is well suited to third-generation synchrotron radiation sources and was experimentally applied to determine the spatial coherence length and the source size at the European Synchrotron Radiation Facility.
Kohn
V
Russian Research Centre "Kurchatov Institute," 123182 Moscow, Russia.
Snigireva
I
Snigirev
A