title: Topographic and phase-contrast imaging in atomic force microscopy
abstract: Phase-contrast imaging in the tapping mode atomic force microscopy (AFM) is a powerful method in surface characterization. This method can provide fine details about rough surfaces, which are normally obscured in topographic imaging. To illustrate some of the capabilities of phase-contrast imaging, AFM studies of Pt/Ti/SiO2/Si and Pb(Zr0.52Ti0.48)O3 (PZT) films were carried out. Phase-contrast imaging revealed fine details of their microstructures, including grain boundaries, triple junctions and twinning, which could not be detected by topographic imaging. The studies showed that phase-contrast imaging is capable of providing superior information about surface characteristics when compared to the standard topographic imaging.
authors.affiliation: Department of Applied Physics, Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong.
authors.initials: GK
authors.lastname: Pang
authors.initials: KZ
authors.lastname: Baba-Kishi
authors.initials: A
authors.lastname: Patel