title: Electronic absorption and Raman resonance scattering of spectroscopically pure SiO2.
abstract: An ultraviolet absorption, as well as Stokes and anti-Stokes Raman resonance scattering of spectroscopically pure SiO2 was investigated by flash photolysis technique. The whole spectrum of 'absorption and scattered bands' was recorded photographically in ultraviolet. A resonance absorption line was observed at 288.2 nm, without structure, while scattered lines were observed at 285-288.2 and 288.2-290 nm.
authors.affiliation: Department of Physics, Ankara University, Tandogan,Turkey. ayaman@science.ankara.edu.tr
authors.forename: A
authors.initials: A
authors.lastname: Yaman
authors.forename: A B
authors.initials: AB
authors.lastname: Bayrakçeken
authors.forename: O J
authors.initials: OJ
authors.lastname: Demir
authors.forename: F
authors.initials: F
authors.lastname: Bayrakçeken
mesh_terms: D012822:Silicon Dioxide / Q000737:chemistry*; D013055:Spectrophotometry, Infrared / Q000379:methods*; D013059:Spectrum Analysis, Raman / Q000379:methods*
chemical_list: D012822:Silicon Dioxide