title: Shear modulation force microscopy study of near surface glass transition temperatures
abstract: We report results of glass transition (T(g)) measurements for polymer thin films using atomic force microscopy (AFM). The AFM mode, shear modulation force microscopy (SMFM), involves measuring the temperature-dependent shear force on a tip modulated parallel to the sample surface. Using this method we have measured the surface T(g) of thin (17-500 nm) polymer films and found that T(g) is independent of film thickness (t>17 nm), strength of substrate interactions, or even presence of substrate.
authors.affiliation: Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794-2275, USA.
authors.initials: S
authors.lastname: Ge
authors.initials: Y
authors.lastname: Pu
authors.initials: W
authors.lastname: Zhang
authors.initials: M
authors.lastname: Rafailovich
authors.initials: J
authors.lastname: Sokolov
authors.initials: C
authors.lastname: Buenviaje
authors.initials: R
authors.lastname: Buckmaster
authors.initials: RM
authors.lastname: Overney