title: Direct measurement of transverse coherence length of hard X rays from interference fringes
abstract: We propose a simple interferometric technique for hard x-ray spatial coherence characterization, recording a Fresnel interference pattern produced by a round fiber or a slit. We have derived analytical formulas that give a direct relation between a visibility of interference fringes and either the source size or the transverse coherence length. The technique is well suited to third-generation synchrotron radiation sources and was experimentally applied to determine the spatial coherence length and the source size at the European Synchrotron Radiation Facility.
authors.affiliation: Russian Research Centre "Kurchatov Institute," 123182 Moscow, Russia.
authors.initials: V
authors.lastname: Kohn
authors.initials: I
authors.lastname: Snigireva
authors.initials: A
authors.lastname: Snigirev