Correlative high-resolution morphologic analysis of the three-dimensional organization of human chromosomes.
A correlative morphologic analysis was carried out on isolated metaphase chromosomes by means of field emission in-lens scanning electron microscopy (FEISEM) and atomic force microscopy (AFM). Whereas FEISEM provides ultra-high resolution power and allows the surface analysis of biological structures free of any conductive coating, the AFM allows imaging of biological specimens in ambient as well as in physiologic conditions. The analysis of the same samples was made possible by the use of electrical conductive and light transparent ITO glass as specimen holder. Further preparation of the specimen specific for the instrumentation was not required. Both techniques show a high correlation of the respective morphologic information, improving their reciprocal biological significance. In particular, the biological coat represents a barrier for surface morphologic analysis of chromosome spreads and it is sensitive to protease treatment. The chemical removal of this layer permits high-resolution imaging of the chromatid fibers but at the same time alters the chromosomal dimension after rehydration. The high-resolution level, necessary to obtain a precise physical mapping of the genome that the new instruments such as FEISEM and AFM could offer, requires homogeneously cleaned samples with a high grade of reproducibility. A correlative microscopical approach that utilizes completely different physical probes provides complementary useful information for the understanding of the biological, chemical, and physical characteristics of the samples and can be applied to optimize the chromosome preparations for further improvement of the knowledge about spatial genome organization.
Gobbi
P
P
Department of Human Anatomy, University of Bologna, Italy. pgobbi@biocfarm.unibo.it
Thalhammer
S
S
Falconi
M
M
Stark
R W
RW
Heckl
W M
WM
Mazzotti
G
G
D002877:Chromosomes, Human / Q000648:ultrastructure*; D018922:HL-60 Cells; D006801:Humans; D018625:Microscopy, Atomic Force; D008855:Microscopy, Electron, Scanning