Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions
We present here an efficient method to prepare a transmission electron microscopy (TEM) specimen for selective observation of the cross-section of individual nanoscale structures. As a typical example, the cross-sectional TEM observation of a quasi-one-dimensional material - a nano-electronic component based on an individual carbon nanotube - is presented.
Wei
B
Max-Planck-lnstitut fur Metallforschung, Seestrasse, Stuttgart, Germany. weib@rpi.edu
Kohler-Redlich
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Bader
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Heiland
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Spolenak
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Arzt
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Ruhle
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