title: Kinetic roughening in polymer film growth by vapor deposition.
abstract: The growth front roughness of linear poly( p-xylylene) films grown by vapor deposition polymerization has been investigated using atomic force microscopy. The interface width w increases as a power law of film thickness d, w approximately d(beta), with beta = 0. 25+/-0.03, and the lateral correlation length xi grows as xi approximately d(1/z), with 1/z = 0.31+/-0.02. This novel scaling behavior is interpreted as the result of monomer bulk diffusion, and belongs to a new universality class that has not been discussed previously.
authors.affiliation: Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180-3590, USA.
authors.forename: Y P
authors.initials: YP
authors.lastname: Zhao
authors.forename: J B
authors.initials: JB
authors.lastname: Fortin
authors.forename: G
authors.initials: G
authors.lastname: Bonvallet
authors.forename: G C
authors.initials: GC
authors.lastname: Wang
authors.forename: T M
authors.initials: TM
authors.lastname: Lu