title: Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions
abstract: We present here an efficient method to prepare a transmission electron microscopy (TEM) specimen for selective observation of the cross-section of individual nanoscale structures. As a typical example, the cross-sectional TEM observation of a quasi-one-dimensional material - a nano-electronic component based on an individual carbon nanotube - is presented.
authors.affiliation: Max-Planck-lnstitut fur Metallforschung, Seestrasse, Stuttgart, Germany. weib@rpi.edu
authors.initials: B
authors.lastname: Wei
authors.initials: P
authors.lastname: Kohler-Redlich
authors.initials: U
authors.lastname: Bader
authors.initials: B
authors.lastname: Heiland
authors.initials: R
authors.lastname: Spolenak
authors.initials: E
authors.lastname: Arzt
authors.initials: M
authors.lastname: Ruhle