title: Singularity spectra of rough growing surfaces from wavelet analysis
abstract: We apply the wavelet transform modulus maxima method [A. Arneodo, N. Decoster, and S. G. Roux, Phys. Rev. Lett. 83, 1255 (1999)] to the analysis of simulated surfaces grown by molecular-beam epitaxy. In contrast to the structure function approach commonly used in the literature, this method permits an investigation of the complete singularity spectrum. We focus on a kinetic Monte Carlo model with Arrhenius dynamics, which in particular takes into consideration the process of thermally activated desorption of particles. We find a wide spectrum of Holder exponents, which reflects the multiaffine surface morphology. Although our choice of parameters yields small desorption rates (<3%), we observe a dramatic change in the singularity spectrum, which is shifted toward smaller Holder exponents. Our results offer a mathematical foundation of anomalous scaling: We identify the global exponent alpha(g) with the Holder exponent that maximizes the singularity spectrum.
authors.affiliation: Institut fur Theoretische Physik, Julius-Maximilians-Universitat Wurzburg, Am Hubland, 97074 Wurzburg, Germany.
authors.initials: M
authors.lastname: Ahr
authors.initials: M
authors.lastname: Biehl