title: Adhesion artefacts in atomic force microscopy imaging
abstract: Artefacts that affect contrast and arise from adhesion forces in atomic force microscopy images of aramid fibres (both fresh and plasma-treated) are investigated. It is demonstrated that these stem not only from variations in the chemical composition of the surface but also from certain topographical features (which may appear hidden or enhanced in the images), resulting in changes in the lateral forces that are detected by the cantilever and are comparable to the vertical forces. It is also shown that both types of contribution to the forces can be uncoupled to yield images free from these artefacts, thus allowing more accurate quantitative measurements. These artefactual effects are also generally applicable to many other materials.
authors: Instituto Nacional del Carbon, CSIC, La Corredoria s/n, Apartado 73, 33080 Oviedo, Spain.
authors: JI
authors: Paredes
authors: A
authors: Martinez-Alonso
authors: JM
authors: Tascon