Broadband antireflection properties of thin heterogeneous dielectric films.
New exactly solvable flexible models of inhomogeneous thin film with smooth and deep variations of dielectric susceptibility epsilon(z) are presented. Formation of cutoff frequencies of such films (as well as the broadband antireflection), controlled by the profiles epsilon(z), is shown. The crucial role of gradients of epsilon(z) in the optics of strongly inhomogeneous media is emphasized.
Shvartsburg
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Central Design Bureau for Unique Instrumentation of the Russian Academy of Sciences, Moscow.
Petite
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Hecquet
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