title: Secondary ion mass spectrometry in the characterisation of boron-based ceramics.
abstract: A secondary ion mass spectrometry (SIMS) study of Zr- and Ti-based borides is reported: ZrB2 ceramic samples (with and without nickel addition) and a TiB2-Ni-B4C/Cu joint were investigated. For Zr-based samples, SIMS measurements show evidence for induced effects by the presence of nickel with regard to oxygen and hydrogen absorption and zirconia formation. In the case of the TiB2-Ni-B4C/Cu joint, the ceramic-metal interface region was analysed and the extent of Cu diffusion into the ceramic material was established. SIMS results were in agreement with previously obtained SEM-EDS data.
authors.affiliation: IPELP, CNR, Corso Stati Uniti 4, 35127 Padova, Italy.
authors.forename: S
authors.initials: S
authors.lastname: Daolio
authors.forename: M
authors.initials: M
authors.lastname: Fabrizio
authors.forename: C
authors.initials: C
authors.lastname: Piccirillo
authors.forename: M L
authors.initials: ML
authors.lastname: Muolo
authors.forename: A
authors.initials: A
authors.lastname: Passerone
authors.forename: A
authors.initials: A
authors.lastname: Bellosi