Secondary ion mass spectrometry in the characterisation of boron-based ceramics.
A secondary ion mass spectrometry (SIMS) study of Zr- and Ti-based borides is reported: ZrB2 ceramic samples (with and without nickel addition) and a TiB2-Ni-B4C/Cu joint were investigated. For Zr-based samples, SIMS measurements show evidence for induced effects by the presence of nickel with regard to oxygen and hydrogen absorption and zirconia formation. In the case of the TiB2-Ni-B4C/Cu joint, the ceramic-metal interface region was analysed and the extent of Cu diffusion into the ceramic material was established. SIMS results were in agreement with previously obtained SEM-EDS data.
Daolio
S
S
IPELP, CNR, Corso Stati Uniti 4, 35127 Padova, Italy.
Fabrizio
M
M
Piccirillo
C
C
Muolo
M L
ML
Passerone
A
A
Bellosi
A
A