title: Can atomic force microscopy achieve atomic resolution in contact mode?
abstract: Atomic force microscopy operating in the contact mode is studied using total-energy pseudopotential calculations. It is shown that, in the case of a diamond tip and a diamond surface, it is possible for a tip terminated by a single atom to sustain forces in excess of 30 nN. It is also shown that imaging at atomic resolution may be limited by blunting of the tip during lateral scanning.
authors.affiliation: Theory of Condensed Matter, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 OHE, United Kingdom.
authors.forename: M R
authors.initials: MR
authors.lastname: Jarvis
authors.forename: R
authors.initials: R
authors.lastname: Pérez
authors.forename: M C
authors.initials: MC
authors.lastname: Payne