Polyol-Mediated Preparation of Nanoscale Oxide Particles We thank Jacqueline Merikhi and Gerd Much for carrying out the scanning electron microscopy (SEM) and the atomic force microscopy (AFM) investigations, respectively.
Feldmann
Claus
C
Philips GmbH Forschungslaboratorien 52066 Aachen (Germany).
Jungk
Hans-Otto
HO