Solving modulated structures by X-ray and electron crystallography.
X-ray diffraction can be used for accurately determining not only classical, ordinary structures, but also modulated ones. For structures with weak modulations, the modulation induced satellite reflections are often hard to be observed by X-ray diffraction, but they appear clearly in electron diffraction. In these cases, X-ray diffraction will give only average structures whereas electron diffraction will yield information about the modulations. Sr(1.4)Ta(0.6)O(2.9) is a complex modulated compound with weak modulation and small modulated domains. Here we demonstrate the power of combining X-ray and electron crystallography for studying modulated structures on powders. The modulations of Sr(1.4)Ta(0.6)O(2.9) were determined from electron diffraction (SAED) and high resolution electron microscopy (HREM) images. With specially developed image processing techniques, the weak modulations were enhanced, facilitating the interpretation of HREM images in terms of atomic structure.
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Institut des Matériaux Jean Rouxel, UMR 6502, 2 rue de la Houssinière, BP 32229, 44322 Nantes Cedex 03, France.
Deniard
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Zou
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Marchand
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Diot
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Brec
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