Scaling-index method as an image processing tool in scanning-probe microscopy.
The scaling-index method (SIM) is a novel tool for image processing in scanning-probe microscopy. Originating from the theory of complex systems, the SIM can be used in order to extract structural information from arbitrary data sets. This method can readily be applied to the analysis of digital atomic-force microscopy (AFM) images. Especially for biomedical diagnostics, where genetic material is investigated by various microscopic methods, a reliable image segmentation based on the SIM algorithm is helpful. As a first application, AFM-images of GTG-banded human metaphase chromosomes (with G bands obtained by Trypsin using Giemsa) are compared with micrographs from conventional light microscopy by means of a scaling-index analysis. While the grey-level distributions of the optical and the AFM-images are largely different from each other, the scaling-index images are remarkably similar. Using this method, a fingerprint of an image can be produced which helps in the classification and interpretation of the measured data.
Jamitzky
F
F
Institut für Kristallographie und Angewandte Mineralogie, Universität München, Germany. f.jamitzky@mpe-garching.mpg.de
Stark
R W
RW
Bunk
W
W
Thalhammer
S
S
Rath
C
C
Aschenbrenner
T
T
Morfill
G E
GE
Heckl
W M
WM
D000465:Algorithms; D002871:Chromosome Banding; D002877:Chromosomes, Human / Q000648:ultrastructure*; D006801:Humans; D008677:Metaphase; D018625:Microscopy, Atomic Force / Q000379:methods*