Leaf position error during conformal dynamic arc and intensity modulated arc treatments.
Conformal dynamic arc (CD-ARC) and intensity modulated arc treatments (IMAT) are both treatment modalities where the multileaf collimator (MLC) can change leaf position dynamically during gantry rotation. These treatment techniques can be used to generate complex isodose distributions, similar to those used in fix-gantry intensity modulation. However, a beam-hold delay cannot be used during CD-ARC or IMAT treatments to reduce spatial error. Consequently, a certain amount of leaf position error will have to be accepted in order to make the treatment deliverable. Measurements of leaf position accuracy were taken with leaf velocities ranging from 0.3 to 3.0 cm/s. The average and maximum leaf position errors were measured, and a least-squares linear regression analysis was performed on the measured data to determine the MLC velocity error coefficient. The average position errors range from 0.03 to 0.21 cm, with the largest deviations occurring at the maximum achievable leaf velocity (3.0 cm/s). The measured MLC velocity error coefficient was 0.0674 s for a collimator rotation of 0 degrees and 0.0681 s for a collimator rotation of 90 degrees. The distribution in leaf position error between the 0 degrees and 90 degrees collimator rotations was within statistical uncertainty. A simple formula was developed based on these results for estimating the velocity-dependent dosimetric error. Using this technique, a dosimetric error index for plan evaluation can be calculated from the treatment time and the dynamic MLC leaf controller file.
Ramsey
C R
CR
Department of Radiation Oncology, Thompson Cancer Survival Center, Knoxville, Tennessee 37921, USA. cramsey@utk.edu
Spencer
K M
KM
Alhakeem
R
R
Oliver
A L
AL
D055592:Biophysical Phenomena; D001703:Biophysics; D006801:Humans; D008297:Male; D011471:Prostatic Neoplasms / Q000532:radiotherapy; D011879:Radiotherapy Dosage; D020266:Radiotherapy, Conformal / Q000295:instrumentation / Q000379:methods* / Q000706:statistics & numerical data