Multilayer Formation on a Curved Drop Surface This work was supported by the Max-Planck-Gesellschaft, the President fund of the Chinese Academy Science as well as the National Natural Science Foundation of China (NNSFC). We thank Marc Schneider for performing the atomic force mircoscopy (AFM) measurements and H. Möhwald (MPI, Golm) for critically reading the manuscript.
International Joint Laboratory Center for Molecular Science Institute of Chemistry Chinese Academy of Science De Wai, Bei Sha Tan, Beijing 100101 (P.R. China).
Jun Bai
JB
Li
Yi
Y
Zhang
Ling Long
LL
Yan