title: Anomalous dispersion behavior of multiple-wave X-ray diffraction at absorption edges: determination of phase change at resonance.
abstract: The effects of anomalous dispersion (resonance) on multiple reflection of x rays and their interference in crystals at atomic absorption edges are studied. Intensity ratios of two inversion-symmetry-related multiple diffractions at or near absorption edges exhibit highly phase-sensitive profiles with strong asymmetric characteristics, unlike those far from the edges. A new resonance perturbation Bethe approach is developed to explain this behavior. This leads to direct determination of the phase change for x-ray reflections at resonance.
authors: Department of Physics, National Tsing Hua University, Hsinchu, Taiwan, Republic of China.
authors: Y P
authors: YP
authors: Stetsko
authors: G Y
authors: GY
authors: Lin
authors: Y S
authors: YS
authors: Huang
authors: C H
authors: CH
authors: Chao
authors: S L
authors: SL
authors: Chang