title: Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy.
abstract: A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.
authors: Department of Chemistry, University of Cambridge, UK.
authors: B L
authors: BL
authors: Weeks
authors: Z H
authors: ZH
authors: Barber
authors: M
authors: M
authors: Raval
authors: M E
authors: ME
authors: Welland
authors: T
authors: T
authors: Rayment