Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy.
A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.
Weeks
B L
BL
Department of Chemistry, University of Cambridge, UK.
Barber
Z H
ZH
Raval
M
M
Welland
M E
ME
Rayment
T
T