Anomalous dispersion behavior of multiple-wave X-ray diffraction at absorption edges: determination of phase change at resonance.
The effects of anomalous dispersion (resonance) on multiple reflection of x rays and their interference in crystals at atomic absorption edges are studied. Intensity ratios of two inversion-symmetry-related multiple diffractions at or near absorption edges exhibit highly phase-sensitive profiles with strong asymmetric characteristics, unlike those far from the edges. A new resonance perturbation Bethe approach is developed to explain this behavior. This leads to direct determination of the phase change for x-ray reflections at resonance.
Stetsko
Y P
YP
Department of Physics, National Tsing Hua University, Hsinchu, Taiwan, Republic of China.
Lin
G Y
GY
Huang
Y S
YS
Chao
C H
CH
Chang
S L
SL