title: Desorption-ionization mass spectrometry using deposited nanostructured silicon films.
abstract: We present a method for desorption ionization on silicon based on novel column/void-network-deposited silicon thin films. A number of different peptides and proteins in the < or = 6000 Daltons range are analyzed by time-of-flight mass spectrometry in this demonstration of our approach. A variety of sample preparation conditions, including the use of chemical additives, surface treatments, and sample purification are used to show the potential of mass analysis using deposited column/void-network silicon films for high throughput proteomic screening.
authors: Nanofabrication Facility, The Pennsylvania State University, University Park 16802, USA. jdc167@psu.edu
authors: J D
authors: JD
authors: Cuiffi
authors: D J
authors: DJ
authors: Hayes
authors: S J
authors: SJ
authors: Fonash
authors: K N
authors: KN
authors: Brown
authors: A D
authors: AD
authors: Jones
mesh_terms: D019343:Citric Acid / Q000737:chemistry; D010455:Peptides / Q000737:chemistry; D011506:Proteins / Q000737:chemistry; D021241:Spectrometry, Mass, Electrospray Ionization / Q000379:methods*
chemical_list: D010455:Peptides; D011506:Proteins; D019343:Citric Acid