title: Analysis of broadband x-ray spectra of highly charged krypton from a microcalorimeter detector of an electron-beam ion trap.
abstract: Spectra of highly charged Kr ions, produced in an electron-beam ion trap (EBIT), have been recorded in a broad x-ray energy band (0.3 keV to 4 keV) with a microcalorimeter detector. Most of the spectral lines have been identified as transitions of B- to Al-like Kr. The transition energies have been determined with 0.2% uncertainty. A semi-empirical EBIT plasma model has been created to calculate a synthetic spectrum of highly charged Kr and to determine a charge state distribution of Kr ions inside the EBIT.
authors: National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
authors: I
authors: I
authors: Kink
authors: J M
authors: JM
authors: Laming
authors: E
authors: E
authors: Takács
authors: J V
authors: JV
authors: Porto
authors: J D
authors: JD
authors: Gillaspy
authors: E
authors: E
authors: Silver
authors: H
authors: H
authors: Schnopper
authors: S R
authors: SR
authors: Bandler
authors: M
authors: M
authors: Barbera
authors: N
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authors: Brickhouse
authors: S
authors: S
authors: Murray
authors: N
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authors: Madden
authors: D
authors: D
authors: Landis
authors: J
authors: J
authors: Beeman
authors: E E
authors: EE
authors: Haller