title: Geometry-dependent dephasing in small metallic wires.
abstract: Temperature dependent weak localization is measured in metallic nanowires in a previously unexplored size regime down to width w = 5 nm. The dephasing time, tau(phi), shows a low temperature T dependence close to quasi-1D theoretical expectations (tau(phi) approximately T(-2/3)) in the narrowest wires, but exhibits a relative saturation as T-->0 for wide samples of the same material, as observed previously. As only sample geometry is varied to exhibit both suppression and divergence of tau(phi), this finding provides a new constraint on models of dephasing phenomena.
authors: Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974, USA.
authors: D
authors: D
authors: Natelson
authors: R L
authors: RL
authors: Willett
authors: K W
authors: KW
authors: West
authors: L N
authors: LN
authors: Pfeiffer