title: Structure of interfacial liquids: X-ray scattering studies.
abstract: We have used synchrotron x rays to study three different liquids near solid-liquid interfaces. For either ultrathin (45-90 A) or thick ( approximately 5000 A) liquid films on silicon substrates, we find (on the basis of diffraction peaks or specular reflectivity data) that the molecules form 3-6 layers at the interface, with plane spacings close to the molecular dimensions. Rough surfaces and/or impurities reduce the density oscillation amplitudes. Making the liquid film very thin does not observably enhance the effect, which implies that layering is present even at an isolated interface (i.e., in a semi-infinite liquid). On the other hand, predeposited impurities diffuse away from the interface more easily if the liquid films are thick. The liquids studied are nonconducting, nonpolar, and nonreactive; the molecules are roughly spherical; and our substrate surface has no lateral structure. Thus our observations should apply to any liquid near a hard wall.
authors: Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60208-3112, USA.
authors: C J
authors: CJ
authors: Yu
authors: A G
authors: AG
authors: Richter
authors: J
authors: J
authors: Kmetko
authors: S W
authors: SW
authors: Dugan
authors: A
authors: A
authors: Datta
authors: P
authors: P
authors: Dutta