title: Polarization-resolved output analysis of X-ray multiple-wave interaction.
abstract: The polarization suppression of the interfering components in X-ray multiple-wave interaction is observed for the first time by using a polarization analyzer with an arbitrary inclination of the diffraction plane with respect to that of the investigated crystal. The condition for total suppression of the multiple-wave interaction outside the investigated crystals by a polarization analyzer is derived theoretically from the modified Born approximation. By means of the partial suppression of the strong interfering component, the increase in the visibility of multiple-wave interference is experimentally and theoretically demonstrated. The proposed experimental polarization-resolved technique provides an operational way to enhance the visibility of X-ray multiple-wave interaction outside the investigated crystals for direct phase determination.
authors.affiliation: Department of Physics, National Tsing Hua University, Hsinchu, Taiwan. stetsko@phys.nthu.edu.tw
authors.forename: Y P
authors.initials: YP
authors.lastname: Stetsko
authors.forename: H J
authors.initials: HJ
authors.lastname: Juretschke
authors.forename: Y S
authors.initials: YS
authors.lastname: Huang
authors.forename: Y R
authors.initials: YR
authors.lastname: Lee
authors.forename: T C
authors.initials: TC
authors.lastname: Lin
authors.forename: S L
authors.initials: SL
authors.lastname: Chang