Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging.
We have shown that energy-loss spectroscopy in a medium-voltage transmission electron microscope can measure concentrations of boron (in a carbon matrix) down to 0.2%, with 10% accuracy. The detection limit is determined by electron-beam shot-noise statistics and by gain variations in the photodiode or charge-coupled-diode array.
Zhu
Y
Y
Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973-5000, USA. zhu@bnl.gov
Egerton
R F
RF
Malac
M
M
D001895:Boron / Q000032:analysis*; D008854:Microscopy, Electron; D012680:Sensitivity and Specificity
D001895:Boron