title: Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging.
abstract: We have shown that energy-loss spectroscopy in a medium-voltage transmission electron microscope can measure concentrations of boron (in a carbon matrix) down to 0.2%, with 10% accuracy. The detection limit is determined by electron-beam shot-noise statistics and by gain variations in the photodiode or charge-coupled-diode array.
authors.affiliation: Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973-5000, USA. zhu@bnl.gov
authors.forename: Y
authors.initials: Y
authors.lastname: Zhu
authors.forename: R F
authors.initials: RF
authors.lastname: Egerton
authors.forename: M
authors.initials: M
authors.lastname: Malac
mesh_terms: D001895:Boron / Q000032:analysis*; D008854:Microscopy, Electron; D012680:Sensitivity and Specificity
chemical_list: D001895:Boron