Near-field tomography without phase retrieval.
We investigate the near-field inverse scattering problem with evanescent waves. An analytic solution to this problem within the weak-scattering approximation is used to show that the usual Rayleigh limit may be overcome even when measurements are made without phase information. Applications to a novel form of three-dimensional microscopy with subwavelength resolution are described.
Carney
P S
PS
Department of Electrical Engineering, Washington University, St. Louis, Missouri 63130, USA.
Markel
V A
VA
Schotland
J C
JC