title: Application of atomic scale STEM techniques to the study of interfaces and defects in materials.
abstract: Incoherent imaging and analysis techniques in the scanning transmission electron microscope (STEM) provide the potential to map changes in structure, composition and bonding that occur at materials interfaces and defects on the fundamental atomic scale. Such comprehensive characterization capabilities permit a detailed analysis of the structure-property relationships of interfaces and defects to be performed. In this paper, we discuss the resolution limits of such techniques in the JEOL 2010F STEM/TEM operating both under standard conditions and at elevated temperatures. Examples of the use of such techniques to quantify the atomic scale defect chemistry at interfaces and defects in perovskite oxides, the growth and structure of II-VI and III-V quantum dots and the electronic structure of threading dislocations in GaN will also be presented.
authors.affiliation: Department of Physics, University of Illinois at Chicago, 60607-7059, USA. browning@uic.edu
authors.forename: N D
authors.initials: ND
authors.lastname: Browning
authors.forename: I
authors.initials: I
authors.lastname: Arslan
authors.forename: Y
authors.initials: Y
authors.lastname: Ito
authors.forename: E M
authors.initials: EM
authors.lastname: James
authors.forename: R F
authors.initials: RF
authors.lastname: Klie
authors.forename: P
authors.initials: P
authors.lastname: Moeck
authors.forename: T
authors.initials: T
authors.lastname: Topuria
authors.forename: Y
authors.initials: Y
authors.lastname: Xin